2019 г.

Scalability analysis of magneticnano-junction-based STT-MRAM towards sub-20-nm technology nodes

Автор(ы): Демин Г.Д., Попов А.В., Попков А.Ф.
Опубликовано: Proceedings of SPIE - The International Society for Optical Engineering Сер. "International Conference on Micro- and Nano-Electronics 2018". – 2019. – Р. 110220C
Ссылка: https://www.spiedigitallibrary.org/conference-proceedings-of-spie on 03 Apr 2019
DOI: 10.1117/12.2522478
Статус: Scopus, Web of Science, РИНЦ