2019 г.

Mapping charge carrier mobility at nanoscale

Автор(ы): Алексеев А.М., А.Ердисов, С.Харинцев
Опубликовано: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019) 2019. – С. 126.
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