2019 г.

Investigation of Gallium Nitride Island Films on Sapphire Substrates via Scanning Electron Microscopy and Spectral Ellipsometry

Автор(ы): Дедкова А.А., Киреев В.Ю., Митько С.В., M. O. Nikiforov
Опубликовано: Nanotechnologies in Russia 2019. – V. 14, Nos. 3-4. – P. 176-183.
DOI: 10.1134/S1995078019020046
Статус: Scopus, Web of Science, Ядро Web of Science