2019 г.

TCAD-based perfomance analysis of nanoscale vacuum field-emission transistors at advanced technology nodes.

Автор(ы): Дюжев Н. А., Махиборода М.А., Демин Г.Д., Евсиков И.Д.
Опубликовано: Proceedings of SPIE - The International Society for Optical Engineering Сер. "International Conference on Micro- and Nano-Electronics 2018". – 2019. – С. 110220O
Ссылка: https://www.spiedigitallibrary.org/conference-proceedings-of-spie on 03 Apr 2019
DOI: 10.1117/12.2522483
Статус: Scopus, Web of Science, РИНЦ