2019 г.

Atomic force microscopy study of field emission from a single silicon nanotip into a quasi-vacuum (air) medium at the nanoscale

Автор(ы): Дюжев Н. А., Махиборода М.А., Демин Г.Д., Митько С.В., Новиков Д.В., Филиппов Н.А.
Опубликовано: 5th International Conference on Advanced Energy Materials-2019. Guildford, United Kingdom. Abstract book _
Статус: -